JESD22 A114F PDF
STM and JESDAF respectively. A typical Human Body Model circuit is presented in Figure 1. Figure 1: Typical Human Body Model Circuit. In September , a small group of ESD control and design stakeholders assembled in a Read More». In the EERC Resource Center. A Dash of Maxwell’s. JESDAF. – IEC (C= pF). – MIL method Pulse parameters. HBM. Reference voltage. 2KV 4KV. Peak current. A A.
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This tester issue was found to divert significant current away from the pins connected to Terminal B, such that the slew-rate of the current at terminal B is lower than seen at Terminal A. Apply a positive and negative V pulse and verify that the waveform meets the requirements defined in Table 1.
Any part that passes after exposure to an ESD pulse of V. The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. The actual number of pin combination sets depends on the number of power pin groups. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint.
Guard band testing is also permitted. When replacing only a single a114c of a given combination, the opposite polarity shall be used when adopting this reverse pin combination alternative.
This part of the slow decay shall be excluded in determining the trailing pulse magnitude. Power pins and Power Pin Groups are defined in 4.
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM) | JEDEC
Connect this pin to Terminal B and then connect the socket pin with the longest wiring path from the pulse generating circuit to the test socket to Terminal A normally provided by the manufacturer.
When the optional shunt resistance as specified in 3. Power pins that are directly connected by metal inside the package form a power pin group. Attach a shorting wire between these pins with the current probe around the shorting wire. Power pins and Power Pin Groups are defined in 4. This tester issue was found to divert significant current away from the pins connected to Terminal B, such that the slew-rate a14f the current at terminal B is lower than seen at Terminal A.
jesdaf | In Compliance Magazine
In that case, the pin may be tied together with the power pin s connected to the same x114f and treated as one pin for Terminal B connection even though it is labeled a different name. Follow the procedure in step 3.
A voltage probe with a minimum input impedance of 10M? Each Vdd2 pin Vdd2. I recommend jesv22 to the following: The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint.
Any pin that is intended to supply power to another circuit on the same chip must be treated as a power pin.
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
All pins one at time to Gnd2 power pin group 3. To provide better data reproducibility, it is permitted to place a shunt resistance between the pin to be stressed Terminal A and the system ground Terminal B in order to quench the pre-pulse phenomenon and eliminate the voltage rise as long as it does not alter the HBM waveforms jsd22 specified in Table 1 in tester qualification, calibration and waveform verification. Apply a positive and negative V pulse and verify the waveform meets the requirements defined in Table 1.
Due to lack of specifications for this phenomenon, the magnitude of the resulting voltage rise at the stressed pin may vary significantly from tester to tester and can alter the behaviors of some ESD protection circuits. NOTE 6 S2 shall be closed at least 10 milliseconds after the pulse delivery period to ensure the DUT socket is not left in a charged state.
Other pins in the group do not need to be stressed.
Other pins in the group do not need to be stressed. Clarified power pin definitions. A resistance value of 10 kohm or larger is recommended.
Added third jssd22 to table: It is permitted to use the same sample 3 jrsd22 the next higher voltage stress level if all parts pass the failure criteria specified in clause 5 after ESD exposure to a specified voltage level. A resistance value of 10 kohm or larger is recommended. All pins one at time to Gnd3 power pin group 4. The waveform measurements during calibration shall be made using the worst-case pin on the highest pin count board with a positive a114ff clamp socket.
All pins one at time to Vdd1 power pin group 5. The tester-dependent voltage rise was observed to alter the timing of the protection action. The period between waveform checks may be extended providing test data supports the increased interval.